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  Test & Instrumentation
  MMCi Tester

 

 

 

 

 

 

MMCi TESTER

 
Characteristics
Modular Design
Customizable
Expandable
Easy Integration
High Speed and Accuracy
Up to 2500V DC
Up to 1000A DC
Remote Controllable
 
Overview
The MMCi test system is a modular test equipment for the electrical functional test of semiconductor devices. It provides the speed and accuracy needed for testing ICs and discrete devices (e.g. diodes, transistors, sensors...) in frontend or backend.

The MMCi is designed for the use in interaction with test handlers, wafer probers or at stand-alone test stations.

High reliability decreasing time and effort for maintenance.

The modularity, customization and reusability offers a wide range of applications by a low invest.

German technology based on longtime experiences in semiconducter testing, engineering and software development.

Features

 
  
Modular design for easy expansion of the system by MMCi bus up to 128 TMOs

 
Integration to Handler via TTL, GPIB and TCP/IP
   
Test capability for single, continuous and parallel test

   
Connection to other measuring equipment via GPIB (LCR meter, CV meter, RF test equipment etc.)
Remote controllable by TCP/IP
Integrated diagnostic tools

 
User friendly GUI for easy operation and flexible programming
Hardware
HV-SMU 2500V/30mA
Base Control Unit
 
Parallel-Modul 144bit I/O
 
Cooling Modul
SMU 300V/10A
PreDut Modul 16bit I/O
HC-SMU 50V/100A
 
Also available:
DUAL-SMU 160V/150mA
 
HC-SMU 50V/1000A
 
Concept Development:
DUAL-SMU 160V/150mA
 
Multiport-SMU, ninefold +17V/-5V, 50mA
 
Typical test time e.g.
Dual Diode 15 ms

Transistor 25 ms

IGBT 60 ms
Software
MMCI (BCU Software)
MMCI is the interface for the user and allows displaying the measurement data, setting up the MMCi, debugging programs and controlling the functionality of the MMCi.
 
MMES
MMES is the development system for MMCi measurement program. The program can be created, edited, printed and transferred to the MMCi.
 

TUI_MMCi
This software is for setting up and data management of the production lot, generating the datalog and output files, temporary summary for process view, printing the binning summary and creating wafer maps. Barcode scanner will be supported.

Contact
For Sales inquiries or Service requests, please contact us:
 
Malaysia
 
Intotest Sdn Bhd
No. 37 & 39, Jalan IMJ 2,
Taman Perindustrian Malim Jaya,
75250 Melaka,
Malaysia
 
 
Phone:
+6 06 336 1229
+6 06 337 6866 /
           337 6867
Fax: +6 06 336 1228
Email: sales@intotest.com
Website: www.intotest.com
Philippines

NexGen Technology Inc
Unit I, 6th Floor, Westgate Tower,
Investment Drive,
Madrigal Business Park,
Alabang, Muntinlupa City 1770, Philippines
 
Phone: +63 2 490 6904
Fax: +63 2 850 2131
   
Europe

TCS Oberreuther AG
Hochweg 89
93049 Regensburg
Germany

Phone:
+49 941-208230
Fax: +49 941-2082320
Email: info@tcs.ag
 
 
© Intotest Sdn Bhd